I4
Semantic definition
The lower electromagnetic testing current limit in [x In], indicating that for currents lower than I4, the tripping time shall be longer than the associated tripping time, T5, i.e. the device shall not trip instantaneous.

IFC 4.4.0.0 build 20261005 (IFC4X4_DEV_20260525) ⚠ buildingSMART Working Draft. All content is under development.
The lower electromagnetic testing current limit in [x In], indicating that for currents lower than I4, the tripping time shall be longer than the associated tripping time, T5, i.e. the device shall not trip instantaneous.
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Last change: Import properties by bSI-Bot on 2021-01-13T11:27:37+01:00
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